In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

Ewald Niehuis; Rudolf Moellers; Felix Kollmer; Henrik Arlinghaus; Laetita Bernard; Hans Josef Hug; Sasa Vranjkovic; Raphaelle Dianoux; Adi Scheidemann

doi:10.1017/S1431927614012161

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References

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In-Situ TOF-SIMS and SFM Measurements Providing True 3D Chemical Characterization of Inorganic and Organic Nanostructures

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