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In-Situ TEM Observation of Physical Degradation of AlGaN/GaN Devices under Applied Electric Field

Published online by Cambridge University Press:  23 November 2012

H. Ghassemi ,
A. Lang  and
M. Taheri
H. Ghassemi
Affiliation:
Drexel Univ, Philadelphia, PA
A. Lang
Affiliation:
Drexel Univ, Philadelphia, PA
M. Taheri
Affiliation:
Drexel Univ, Philadelphia, PA
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1872 - 1873
Copyright
Copyright © Microscopy Society of America 2012

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