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In-situ Straining Analysis by TEM Orientation Mapping (EBSD-like TEM) - Direct Imaging of Deformation Processes in Nanocrystalline Metals

Published online by Cambridge University Press:  23 November 2012

C. Kuebel ,
A. Kobler  and
H. Hahn
C. Kuebel
Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany
A. Kobler
Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany
H. Hahn
Affiliation:
INT, KIT, Eggenstein-Leopoldshafen, Germany
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 724 - 725
Copyright
Copyright © Microscopy Society of America 2012

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