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In-situ Oxidation State Mapping by Electron Energy-loss Spectroscopy

Published online by Cambridge University Press:  30 July 2020

Liam Spillane ,
Paolo Longo ,
Bernhard Schaffer ,
Ben Miller ,
Paul Thomas  and
Ray Twesten
Liam Spillane
Affiliation:
Gatan Inc., Pleasanton, California, United States
Paolo Longo
Affiliation:
Gatan Inc., Pleasanton, California, United States
Bernhard Schaffer
Affiliation:
Gatan Inc., Pleasanton, California, United States
Ben Miller
Affiliation:
Gatan Inc., Pleasanton, California, United States
Paul Thomas
Affiliation:
Gatan Inc., Pleasanton, California, United States
Ray Twesten
Affiliation:
Gatan Inc., Pleasanton, California, United States

Abstract

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Type
In Situ TEM at the Extremes - Corrosion
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1676 - 1677
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Copyright
Copyright © Microscopy Society of America 2020

References

Schaffer, B., et al. , Microsc. Microanal. 25 (suppl 2), (2019)10.1017/S1431927619003970CrossRefGoogle Scholar