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In-Situ Observations of the Effect of Electron Irradiation on the Defect Microstructure of Alumina

Published online by Cambridge University Press:  02 July 2020

S.-J. Chen ,
U. Dahmen  and
D.G. Howitt
S.-J. Chen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, 94720
U. Dahmen
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, University of California, Berkeley, CA, 94720
D.G. Howitt
Affiliation:
Department of Chemical Engineering and Materials Science, University of California, Davis, CA, 95616
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Extract

The interaction of radiation produced point defects with a dislocation microstructure at high temperature is of considerable interest and careful high voltage microscopy experiments can provide valuable insight into the mechanisms. Veyssière and Westmacott carried out in-situ experiments monitoring the partial dislocation climbs in Ni3Al induced by thermal vacancies as well as by Frenkel pairs produced during irradiation.1 We report here the results of some preliminary experiments we performed on alumina (A12O3) single crystals with high dislocation densities to study the modification of the microstructure by electron irradiation at high temperature.

The dislocation microstructures were produced by shock wave deformation using a high-velocity impact technique. The technique is capable of producing a very high density of defects consisting primarily of basal twins, and slips on the basal, pyramidal and rhombohedral planes in alumina. The dislocations are all of glide type, mostly forming shear bands. A typical microstructure prior to irradiation is shown in figure la.

Type
In Situ Studies in Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 601 - 602
Copyright
Copyright © Microscopy Society of America 1997

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References

Veyssière, P. and Westmacott, K. H., Phil. Mag., 53(1986)563.10.1080/01418618608242854CrossRefGoogle Scholar
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Howitt, D. G. and Mitchell, T. E., Phil. Mag., 44(1981)229.10.1080/01418618108244504CrossRefGoogle Scholar