Hostname: page-component-586b7cd67f-t8hqh Total loading time: 0 Render date: 2024-11-24T20:08:31.229Z Has data issue: false hasContentIssue false
  • English
  • Français

In-Situ Nanoindentation – A Unique Probe Of Deformation Response In Materials

Published online by Cambridge University Press:  01 August 2003

A.M. Minor ,
E.T. Lilleodden ,
M. Jin ,
E.A. Stach ,
D. Chrzan ,
J.W. Morris Jr. ,
T.A. Friedmann ,
X. Xiao ,
O.H. Auciello  and
J.A. Carlisle
A.M. Minor
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
E.T. Lilleodden
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
M. Jin
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 Department of Materials Science and Engineering, University of California, Berkeley, CA 94720
E.A. Stach
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
D. Chrzan
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 Department of Materials Science and Engineering, University of California, Berkeley, CA 94720
J.W. Morris Jr.
Affiliation:
Materials Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 Department of Materials Science and Engineering, University of California, Berkeley, CA 94720
T.A. Friedmann
Affiliation:
Department of Nanostructure and Semiconductor Physics, Sandia National Laboratory, Albuquerque, NM
X. Xiao
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL
O.H. Auciello
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL
J.A. Carlisle
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, IL

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 900 - 901
Copyright
Copyright © Microscopy Society of America 2003