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In-situ Monitoring TEM Specimen Preparation with Different Electron Detectors in a SEM-FIB System

Published online by Cambridge University Press:  01 August 2018

Jian-Guo Zheng
Jian-Guo Zheng*
Affiliation:
Irvine Materials Research Institute, University of California, Irvine, CA, USA.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 636 - 637
Copyright
© Microscopy Society of America 2018 

References

[1] The author would acknowledge the use of IMRI facilities for the SEM/FIB work.Google Scholar