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In-Situ Characterization of Carbon Nanotube-Polystyrene Composite Deformation

Published online by Cambridge University Press:  02 July 2020

D. Qian ,
E. C. Dickey ,
R. Andrews ,
T. Rantell  and
B. Safadi
D. Qian
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, KY40506
E. C. Dickey
Affiliation:
Department of Chemical and Materials Engineering, University of Kentucky, KY40506
R. Andrews
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY40511
T. Rantell
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY40511
B. Safadi
Affiliation:
Center for Applied Energy Research, University of Kentucky, Lexington, KY40511
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Carbon nanotubes (NTs) have novel electronic properties and exceptionally high Young's moduli on the order of TPa. so NTs have potential applications in advanced composite materials such as conductive polymers, electromagnetic-radio frequency interference (EMI/RFI) shielding material and opto-electronic materials. The utility of the nanotubes in composite applications depends strongly on the ability to disperse the NTs homogeneously throughout the matrix without destroying the integrity of the NTs. Furthermore, interfacial bonding between the NT and matrix is necessary to achieve load transfer across the interface, which is desirable for improving the mechanical properties of polymer composites.

In this work, aligned multiwalled carbon nanotubes (MWNTs) produced by continuous chemical vapor deposition (CVD) (see Fig.l), were homogeneously dispersed in polystyrene (PS) matrices by a simple solution-evaporation method. Using this procedure, we made uniform MWNT-PS composite films ∼0.4mm thick for ex-situ mechanical tensile test and very thin films, ∼100nm, for in-situ TEM tests, as shown in Fig.2.

Type
Sir John Meurig Thomas Symposium: Microscopy and Microanalysis in the Chemical Sciences
Information
Microscopy and Microanalysis , Volume 6 , Issue S2: Proceedings: Microscopy & Microanalysis 2000, Microscopy Society of America 58th Annual Meeting, Microbeam Analysis Society 34th Annual Meeting, Microscopical Society of Canada/Societe de Microscopie de Canada 27th Annual Meeting, Philadelphia, Pennsylvania August 13-17, 2000 , August 2000 , pp. 40 - 41
Copyright
Copyright © Microscopy Society of America

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References

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6. This work was supported by the NSF MRSEC for Advanced Carbon Materials (DMR-9809686).Google Scholar