Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-26T06:47:03.212Z Has data issue: false hasContentIssue false
  • English
  • Français

In-situ Atomic-Resolution Observations of Oxide-Reduction Induced Formation of Nano-Holes in Cu2O Thin Films

Published online by Cambridge University Press:  01 August 2018

Xiaobo Chen ,
Dongxiang Wu ,
Lianfeng Zou ,
Qiyue Yin ,
Hanlei Zhang ,
Dmitri N. Zakharov ,
Eric A. Stach  and
Guangwen Zhou
Xiaobo Chen
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Dongxiang Wu
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Lianfeng Zou
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Qiyue Yin
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Hanlei Zhang
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY
Dmitri N. Zakharov
Affiliation:
Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, NY
Eric A. Stach
Affiliation:
Department of Materials Science and Engineering, University of Pennsylvania, Philadelphia, PA
Guangwen Zhou
Affiliation:
Materials Science and Engineering Program and Department of Mechanical Engineering, State University of New York, Binghamton, NY

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1816 - 1817
Copyright
© Microscopy Society of America 2018 

References

[1] Zou, L., et al, Nat. Commun. 8 2017) p. 307.Google Scholar
[2] Zhou, G. Yang, J. Phys. Rev. Lett. 93 2004) p. 226101.Google Scholar
[3] This work was supported by the U.S. Department of Energy, Office of Basic Energy Sciences, Division of Materials Sciences and Engineering under Award No. DE-SC0001135. This research used resources of the Center for Functional Nanomaterials, which is a U.S. DOE Office of Science Facility, at Brookhaven National Laboratory under Contract No. DE-SC0012704..Google Scholar