Crossref Citations
This article has been cited by the following publications. This list is generated based on data provided by Crossref.
Poulsen, H. F.
Cook, P. K.
Leemreize, H.
Pedersen, A. F.
Yildirim, C.
Kutsal, M.
Jakobsen, A. C.
Trujillo, J. X.
Ormstrup, J.
and
Detlefs, C.
2018.
Reciprocal space mapping and strain scanning using X-ray diffraction microscopy.
Journal of Applied Crystallography,
Vol. 51,
Issue. 5,
p.
1428.
Kutsal, M
Bernard, P
Berruyer, G
Cook, P K
Hino, R
Jakobsen, A C
Ludwig, W
Ormstrup, J
Roth, T
Simons, H
Smets, K
Sierra, J X
Wade, J
Wattecamps, P
Yildirim, C
Poulsen, H F
and
Detlefs, C
2019.
The ESRF dark-field x-ray microscope at ID06.
IOP Conference Series: Materials Science and Engineering,
Vol. 580,
Issue. 1,
p.
012007.
Yildirim, Can
Cook, Phil
Detlefs, Carsten
Simons, Hugh
and
Poulsen, Henning Friis
2020.
Probing nanoscale structure and strain by dark-field x-ray microscopy.
MRS Bulletin,
Vol. 45,
Issue. 4,
p.
277.
Poulsen, H.F.
2020.
Multi scale hard x-ray microscopy.
Current Opinion in Solid State and Materials Science,
Vol. 24,
Issue. 2,
p.
100820.
Poulsen, H. F.
Dresselhaus-Marais, L. E.
Carlsen, M. A.
Detlefs, C.
and
Winther, G.
2021.
Geometrical-optics formalism to model contrast in dark-field X-ray microscopy.
Journal of Applied Crystallography,
Vol. 54,
Issue. 6,
p.
1555.
Dresselhaus-Marais, Leora E.
Winther, Grethe
Howard, Marylesa
Gonzalez, Arnulfo
Breckling, Sean R.
Yildirim, Can
Cook, Philip K.
Kutsal, Mustafacan
Simons, Hugh
Detlefs, Carsten
Eggert, Jon H.
and
Poulsen, Henning Friis
2021.
In situ visualization of long-range defect interactions at the edge of melting.
Science Advances,
Vol. 7,
Issue. 29,
Wehbe, Maya
Charles, Matthew
Baril, Kilian
Alloing, Blandine
Pino Munoz, Daniel
Labchir, Nabil
Zuniga-Perez, Jesús
Detlefs, Carsten
Yildirim, Can
and
Gergaud, Patrice
2023.
Study of GaN coalescence by dark-field X-ray microscopy at the nanoscale.
Journal of Applied Crystallography,
Vol. 56,
Issue. 3,
p.
643.
Garriga Ferrer, Júlia
Rodríguez-Lamas, Raquel
Payno, Henri
De Nolf, Wout
Cook, Phil
Solé Jover, Vicente Armando
Yildirim, Can
and
Detlefs, Carsten
2023.
darfix – data analysis for dark-field X-ray microscopy.
Journal of Synchrotron Radiation,
Vol. 30,
Issue. 3,
p.
527.