Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-28T03:16:35.298Z Has data issue: false hasContentIssue false

Insights into the Electronic Structure of Ceramics Through Quantitative Analysis of Valence Electron Energy-Loss Spectroscopy (VEELS)

Published online by Cambridge University Press:  02 July 2020

Harald Müllejans
Affiliation:
Institute for Advanced Materials, JRC, EC, PO Box 2, NL-1755 ZG, Petten, The Netherlands
Roger H. French
Affiliation:
DuPont Central Research, E356-384 Experimental Station, Wilmington, DE19880, USA
Get access

Extract

The electronic structure of ceramics can be extracted quantitatively from the valence electron energy-loss spectroscopy (VEELS) of transitions between the valence and conduction bands. We obtained VEEL spectra of several ceramics (FIG. 1) with a VG HB501 dedicated STEM equipped with Gatan PEELS. Improved data acquisition and new methods of data analysis allowed us to treat the data fully quantitatively. The reliable and accurate removal of the zero loss peak was crucial because intensities at energy losses just above the band gap of the ceramic material have a large influence on the results. An asymmetric Pearson VII function was fitted into the zero loss peak up to an energy loss for which no transitions are expected (an energy smaller than the band gap of the ceramic) and then extrapolated to higher energies. This limits the analysis to non-metallic materials, exhibiting non-zero band gap energies. We are currently developing methods to perform the analysis on metallic materials, using ellipsometric data in the visible and extrapolate the energy-loss function to 0 eV and thereby remove the need for the no transition energy.

Type
A. Howie Symposium: Celebration of Pioneering Electron Microscopy
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Müllejans, H.et al., Proc. Ann. MSA Meeting 55 (1997) 943.Google Scholar
2.Dorneich, A.D.et al., Journal of Microscopy 191 (1998) 286.CrossRefGoogle Scholar
3.Loughin, S.et al., Journal of Physics D: Applied Physics 29 (1996) 1740.CrossRefGoogle Scholar
4.Müllejans, H. and French., R.H.Journal of Physics D: Applied Physics 29 (1996) 1751.CrossRefGoogle Scholar
5.French, R.H.et al., Acta Materialia 46 (1998) 2271.CrossRefGoogle Scholar
6.French, R.H.et al., Journal of the American Ceramic Society 81 (1998) 2549.CrossRefGoogle Scholar
7. This work was partly carried out at the Max-Planck-Institut für Metallforschung, Stuttgart, Germany and partly within the European Commissions’s Research and Development Programme.Google Scholar