Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T16:38:01.550Z Has data issue: false hasContentIssue false
  • English
  • Français

Insights into Texture and Phase Coexistence in Polycrystalline and Polyphasic Ferroelectric HfO2 Thin Films using 4D-STEM

Published online by Cambridge University Press:  01 August 2018

Everett D. Grimley ,
Sam Frisone ,
Tony Schenk ,
Min Hyuk Park ,
Chris M. Fancher ,
Thomas Mikolajick ,
Jacob L. Jones ,
Uwe Schroeder  and
James M. LeBeau
Everett D. Grimley
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
Sam Frisone
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
Tony Schenk
Affiliation:
NaMLab gGmbH, Dresden, Germany
Min Hyuk Park
Affiliation:
NaMLab gGmbH, Dresden, Germany
Chris M. Fancher
Affiliation:
Neutron Scattering Science Directorate, Oak Ridge National Laboratory, Oak Ridge, TN, USA
Thomas Mikolajick
Affiliation:
NaMLab gGmbH, Dresden, Germany
Jacob L. Jones
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA
Uwe Schroeder
Affiliation:
NaMLab gGmbH, Dresden, Germany
James M. LeBeau
Affiliation:
Department of Materials Science and Engineering, North Carolina State University, Raleigh, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 184 - 185
Copyright
© Microscopy Society of America 2018 

References

[1] Boscke, T. S., et al, Applied Physics Letters 99 2011) p. 102903.Google Scholar
[2] Katayama, K., et al, Journal of Applied Physics 119 2016) p. 134101.Google Scholar
[3] Grimley, E. D., et al, Advanced Materials Interfaces 2018) p. 1701258.Google Scholar
[4] Materlik, R., Kunneth, C. Kersch, A. Journal of Applied Physics 117 2015) p. 134109.Google Scholar
[5] Batra, R., Tan, H. D. Ramprasad, R. Applied Physics Letters 108 2016) p. 172902.Google Scholar
[6] Tate, M. W., et al, Microscopy and Microanalysis 22 2016) p. 237.Google Scholar
[7] EDG and JML acknowledge support from the National Science Foundation (NSF) DMR-1350273. EDG acknowledges support from the NSF Graduate Research Fellowship Program (DGE-1252376). Work was performed in part at the Analytical Instrumentation Facility (a member of RTNN, a site of NNCI) at NCSU, which is supported by the State of NC and the NSF (award number ECCS-1542015).Google Scholar