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In-operando soft X-ray microspectroscopy of organic electronics devices

Published online by Cambridge University Press:  10 August 2018

Rainer H. Fink
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany CENEM, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Benedikt Rosner
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany present address: LMN, Paul Scherrer Institut, Villigen, Switzerland
Xiaoyan Du
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany present address: i-MEET, Friedrich-Alexander-Universitat Erlangen-Nurnberg, Erlangen, Germany
Andreas Spam
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Manuel Johnson
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Tim Hawly
Affiliation:
Physical Chemistry II, Friedrich-Alexander-Universitat Erlangen-Nurnberg (FAU), Erlangen, Germany
Benjamin Watts
Affiliation:
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland
Jorg Raabe
Affiliation:
Swiss Light Source, Paul Scherrer Institut, Villigen, Switzerland
Luca Gregoratti
Affiliation:
Elettra-Sincrotrone Trieste, Area Science Park, Trieste, Italy
Matteo Amati
Affiliation:
Elettra-Sincrotrone Trieste, Area Science Park, Trieste, Italy

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

Reference:

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[7] The authors gratefully acknowledge funding by the German Minister of Education and Research (BMBF, contract 05 K16 WED) and the Deutsche Forschungsgemeinschaft within GRK 1896. X.D. obtained additional support through the China Scholarship Council (CSC). We would like to thank Dr. N. Pillet for experimental support.Google Scholar