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Initial Results From a CdTe High-Energy X-ray Detector on a TEM
Published online by Cambridge University Press: 25 July 2016
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- Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 312 - 313
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- © Microscopy Society of America 2016
References
References:
[1]
James, RB & Siffert, P eds.,
11th International Workshop on Room Temperature Semiconductors and Associated Electronics.
Nucl. Instrum. Methods Phys. Res. A
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(2001). p. 1–603.Google Scholar
[3] The authors acknowledge support from The Ohio State University and the Ohio Third Frontier Research Scholar program.Google Scholar
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