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Initial Results From a CdTe High-Energy X-ray Detector on a TEM

Published online by Cambridge University Press:  25 July 2016

Hendrik O. Colijn
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
David W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

References:

[1] James, RB & Siffert, P eds., 11th International Workshop on Room Temperature Semiconductors and Associated Electronics. Nucl. Instrum. Methods Phys. Res. A 448 (2001). p. 1603.Google Scholar
[3] The authors acknowledge support from The Ohio State University and the Ohio Third Frontier Research Scholar program.Google Scholar