Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-29T07:50:49.653Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of SEM Deposited Protection Layers on FIB Induced Amorphous Damage of TEM Lamella Prepared by ExSolve WTP

Published online by Cambridge University Press:  01 August 2018

M. Najarían ,
Mauricio ,
Gordillo  and
Gavin Dutrow
M. Najarían
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Hillsboro, USA
Gordillo
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Hillsboro, USA
Gavin Dutrow
Affiliation:
Thermo Fisher Scientific, Materials & Structural Analysis, Hillsboro, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1120 - 1121
Copyright
© Microscopy Society of America 2018