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Increased LEAP Utilization Through Automation of Multi-specimen Alignment and Acquisition

Published online by Cambridge University Press:  30 July 2020

David Reinhard
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Tim Payne
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Eric Strennen
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Brian Geiser
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Gard Groth
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States
Dan Lenz
Affiliation:
CAMECA Instruments, Inc., Madison, Wisconsin, United States

Abstract

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Type
Collaborative Analysis Using Atom Probe Tomography Including TEM/APT Characterization of Metal Alloys and Other Material Systems
Copyright
Copyright © Microscopy Society of America 2020

References

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