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In situelectrical testing of device-relevant nanocontacts in the transmission electron microscope

Published online by Cambridge University Press:  25 July 2016

Daan Hein Alsem ,
Siddharth Sood ,
Norman Salmon  and
Tevis D. B. Jacobs
Daan Hein Alsem
Affiliation:
Hummingbird Scientific, LaceyWA, USA.
Siddharth Sood
Affiliation:
Hummingbird Scientific, LaceyWA, USA.
Norman Salmon
Affiliation:
Hummingbird Scientific, LaceyWA, USA.
Tevis D. B. Jacobs
Affiliation:
University of Pittsburgh, Department of Mechanical Engineering and Materials Science, PittsburghPA, USA.

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 818 - 819
Copyright
© Microscopy Society of America 2016 

References

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[10] T.D.B.J. acknowledges support from National Science Foundation under award No. #CMMI-1536800.Google Scholar