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In situ Transmission Electron Microscopy of Lithiation Dynamics in a SnCh Hollow Nanosphere

Published online by Cambridge University Press:  01 August 2018

Joon Ha Chang ,
Jun Young Cheong ,
Il-Doo Kim  and
Jong Min Yuk
Joon Ha Chang
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea
Jun Young Cheong
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea
Il-Doo Kim
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea
Jong Min Yuk
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology, Daejeon, Korea

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1944 - 1945
Copyright
© Microscopy Society of America 2018 

References

[1] Yu, X. -Y., etal, Advanced Energy Materials 6 2016) p. 1501333.Google Scholar
[2] Wang, H., et al, Crystal Engineering Communications 14 2012) p. 5177.Google Scholar
[3] Xiao, Q., et al, Nature Communications 6 2015) p. 8844.Google Scholar
[4] Wang, C. -M., et al, Nano Letters 11 2011) p. 1874.Google Scholar
[5] Chang, J. H., et al, ACS Omega 2 2017) p. 6329.Google Scholar
[6] The authors acknowledge the funding from Korea CCS R&D Center (KCRC) grant by the Korea government (Ministry of Science, ICT & Future Planning) (No. NRF-2014M1A8A1049303), Wearable Platform Materials Technology Center (WMC) (NR-2016R1A5A1009926), Institute for Basic Science (IBS) (IBS-R004-D1) and NRF(National Research Foundation of Korea) Grant funded by Korean Government (NRF-2017H1A2A1042006-Global Ph.D. Fellowship Program) which provided student support; National Research Foundation of Korea(NRF) grant funded by the Korea government (MSIP; Ministry of Science, ICT & Future Planning) (NRF-2017R1C1B5017962) which provided support for TEM characterization..Google Scholar