Hostname: page-component-586b7cd67f-dsjbd Total loading time: 0 Render date: 2024-11-24T23:37:24.403Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ TEM tensile tests of nanoscale Mg samples oriented for basal slip

Published online by Cambridge University Press:  23 November 2012

Q. Yu ,
A. Minor ,
L. Qi ,
J. Li  and
R. Mishra
Q. Yu
Affiliation:
UC Berkeley and National Center for Electron Microscopy, Lawrence Berkeley National Laborator, Berkeley, CA
A. Minor
Affiliation:
UC Berkeley and National Center for Electron Microscopy, Lawrence Berkeley National Laborator, Berkeley, CA
L. Qi
Affiliation:
Department of Nuclear Science and Engineering & Department of Materials Science and Engineering, Massachusetts Institute of Technology, Boston, MA
J. Li
Affiliation:
Department of Nuclear Science and Engineering & Department of Materials Science and Engineering, Massachusetts Institute of Technology, Boston, MA
R. Mishra
Affiliation:
General Motors Research and Development Center, Warren, MI
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 738 - 739
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)