Hostname: page-component-cd9895bd7-dzt6s Total loading time: 0 Render date: 2024-12-28T19:00:03.565Z Has data issue: false hasContentIssue false
  • English
  • Français

In situ TEM Studies of Ferroelectric Thin Films

Published online by Cambridge University Press:  08 April 2017

P Gao ,
C Nelson ,
J Jokisaari ,
S Baek ,
C Eom ,
E Wang  and
X Pan
P Gao
Affiliation:
University of Michigan
C Nelson
Affiliation:
University of Michigan
J Jokisaari
Affiliation:
University of Michigan
S Baek
Affiliation:
University of Wisconsin
C Eom
Affiliation:
University of Wisconsin
E Wang
Affiliation:
Peking University, China
X Pan
Affiliation:
University of Michigan

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1362 - 1363
Copyright
Copyright © Microscopy Society of America 2011