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In situ TEM measurements of nanotube and nanosheet properties

Published online by Cambridge University Press:  23 November 2012

D. Golberg ,
D. Tang ,
X. Wei ,
M. Yamaguchi ,
N. Kawamoto ,
M. Mitome ,
C. Zhi ,
Y. Bando ,
P.J. Costa  and
C. Ren
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D. Golberg
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
D. Tang
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
X. Wei
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
M. Yamaguchi
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
N. Kawamoto
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
M. Mitome
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
C. Zhi
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
Y. Bando
Affiliation:
WPI Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Japan
P.J. Costa
Affiliation:
CICECO, Department of Ceramics and Glass Engineering, University of Aveiro, Aveiro, Portugal
C. Ren
Affiliation:
Institute of Metal Research, Shenyang, China
C. Liu
Affiliation:
Institute of Metal Research, Shenyang, China
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Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 1542 - 1543
Copyright
Copyright © Microscopy Society of America 2012

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