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In situ Single/Cyclic Deformation and Correlated Precession Electron Diffraction Analysis of Nano-laminate Crystalline/Glassy Metal Composites

Published online by Cambridge University Press:  01 August 2018

Qianying Guo
Affiliation:
The University of Alabama, Department of Metallurgical & Materials Engineering, Tuscaloosa, AL, USA
Christopher M. Barr
Affiliation:
Sandia National Laboratories, Department of Radiation Solid Interactions, Albuquerque, NM, USA
Khalid Hattar
Affiliation:
Sandia National Laboratories, Department of Radiation Solid Interactions, Albuquerque, NM, USA
Gregory B. Thompson
Affiliation:
The University of Alabama, Department of Metallurgical & Materials Engineering, Tuscaloosa, AL, USA

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Greer, A., et al, Materials science and Engineering: R: Report 74 2013) p. 71132.Google Scholar
[2] Schuh, C., et al, Acta Materialia 55 2007) p. 40674109.Google Scholar
[3] Bufford, D., et al, Nano Letters 16 2016) p. 49464953.Google Scholar
[4] Kobler, A., et al, Ultramicroscopy 128 2013) p. 6881.Google Scholar
[5] Giannuzzi, L., et al, Micron 30 1999) p. 197204.Google Scholar
[6] Van Swygenhoven, H., et al, Physical Review B 64 2001) p. 224105.Google Scholar
[7] The authors gratefully recognize support from the ARO W911NF-17-1-0528. This work was performed, in part, at the Center for Integrated Nanotechnologies, an Office of Science User Facility operated for the U.S. Department of Energy (DOE) Office of Science. Sandia National Laboratories is a multi-mission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International, Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA-0003525. The Bruker PI-95 indenter was acquired through the NSF-DMR-1531722.Google Scholar