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In Situ Scanning Transmission Electron Microscopy (STEM) of Individual Electrochemical Intercalation Events in Graphite

Published online by Cambridge University Press:  23 September 2015

Jared J. Lodico ,
E. R. White ,
William A. Hubbard ,
Erick Garcia ,
Bradley Parks ,
Brian Zutter  and
B. C. Regan
Jared J. Lodico
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
E. R. White
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
William A. Hubbard
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Erick Garcia
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Bradley Parks
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
Brian Zutter
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA
B. C. Regan
Affiliation:
Department of Physics & Astronomy and California NanoSystems Institute, University of California, Los Angeles, California 90095USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1193 - 1194
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1] Tarascon, J. -M. & Armand, M., Nature 414 (2001). p 359.Google Scholar
[2] Shevitski, B., et al., Physical Review B 87 (2013) 045417.Google Scholar
[3] White, E. R., et al., Appl. Phys. Express 4 (2011) 055201.Google Scholar
[4] This work was supported by NSF DMR-1206849, and in part by FAME, one of six centers of STARnet, a Semiconductor Research Corporation program sponsored by MARCO and DARPA. The authors acknowledge the use of instruments at the Electron Imaging Center for NanoMachines supported by NIH 1S10RR23057 and the CNSI at UCLA.Google Scholar