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In Situ Investigation of Dielectric Breakdown in Field Effect Transistors

Published online by Cambridge University Press:  01 August 2010

CS Bonifacio ,
AM Thron ,
G Bersuker  and
K van Benthem
CS Bonifacio
Affiliation:
University of California, Davis
AM Thron
Affiliation:
University of California, Davis
G Bersuker
Affiliation:
International SEMATECH
K van Benthem
Affiliation:
University of California, Davis

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1298 - 1299
Copyright
Copyright © Microscopy Society of America 2010