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In Situ Heater Design for Nanoscale Synchrotron-Based Full-Field Transmission X-Ray Microscopy

Published online by Cambridge University Press:  05 March 2015

Andrew M. Kiss ,
William M. Harris ,
Arata Nakajo ,
Steve Wang ,
Joan Vila-Comamala ,
Alex Deriy  and
Wilson K. S. Chiu
Andrew M. Kiss
Affiliation:
Department of Mechanical Engineering, University of Connecticut, Storrs, CT 06269-3139, USA
William M. Harris
Affiliation:
Department of Mechanical Engineering, University of Connecticut, Storrs, CT 06269-3139, USA
Arata Nakajo
Affiliation:
Department of Mechanical Engineering, University of Connecticut, Storrs, CT 06269-3139, USA
Steve Wang
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
Joan Vila-Comamala
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
Alex Deriy
Affiliation:
Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA
Wilson K. S. Chiu*
Affiliation:
Department of Mechanical Engineering, University of Connecticut, Storrs, CT 06269-3139, USA
*
*Corresponding author.[email protected]
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Abstract

The oxidation of nickel powder under a controlled gas and temperature environment was studied using synchrotron-based full-field transmission X-ray microscopy. The use of this technique allowed for the reaction to be imaged in situ at 55 nm resolution. The setup was designed to fit in the limited working distance of the microscope and to provide the gas and temperature environments analogous to solid oxide fuel cell operating conditions. Chemical conversion from nickel to nickel oxide was confirmed using X-ray absorption near-edge structure. Using an unreacted core model, the reaction rate as a function of temperature and activation energy were calculated. This method can be applied to study many other chemical reactions requiring similar environmental conditions.

Keywords

transmission X-ray microscopyin situnickel oxidation
Type
Equipment Development
Information
Microscopy and Microanalysis , Volume 21 , Issue 2 , April 2015 , pp. 290 - 297
Copyright
© Microscopy Society of America 2015 

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