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In Operando SEM Imaging of Electrochemical Oxidation of UO2 in Liquid

Published online by Cambridge University Press:  05 August 2019

Xiao-Ying Yu ,
Juan Yao  and
Edgar C. Buck
Xiao-Ying Yu
Affiliation:
Earth and Biological Sciences Directorate, Pacific Northwest National Laboratory (PNNL), Richland, WA 99354, USA.
Juan Yao
Affiliation:
Earth and Biological Sciences Directorate, Pacific Northwest National Laboratory (PNNL), Richland, WA 99354, USA.
Edgar C. Buck
Affiliation:
Energy and Environment Directorate, PNNL, WA 99354, USA.

Abstract

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Type
Microscopy and Microanalysis of Nuclear and Irradiated Materials
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1578 - 1579
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Jerden, JL et al. , J. Nucl. Mater. 462, (2015), 135-146. doi: 10.1016/j.jnucmat.2015.03.036.Google Scholar
[2]Buck, EC et al. , RSC Advances, 8 (2018), 18227-18233.Google Scholar
[3]Yang, L et al. , J. Vac. Sci. Technol. A 29 (2011), art. no., 061101. doi: 10.1116/1.3654147.Google Scholar
[4]Yang, L et al. , Lab Chip 11 (2011), 2481-4. doi: 10.1039/c01c00676a.Google Scholar
[5]Yu, J et al. , Chem. Comm. (2016), 52, 10952-5. doi: 10.1039/c6cc02893d.Google Scholar
[6]Yang, L et al. , Surface Interface Analysis (2015), 46, 224-8. doi: 10.1002/sia.5252.Google Scholar
[7]Yao, J et al. , J. Vis. Exp (2017), 127, e56058. doi: 10.3791/56058.Google Scholar
[8]We acknowledge support from the PNNL Nuclear Science Processing Initiative (NPSI) Laboratory Directed Research and Development fund and instrument access to the DOE BER EMSL user facility under the General User Proposal 50143.Google Scholar