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Improving the Speed and Accuracy of Large-scale Scanning Transmission Electron Microscopy (STEM) Electron Scattering Simulations

Published online by Cambridge University Press:  30 July 2020

Colin Ophus
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Hamish Brown
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Luis Rangel Dacosta
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Philipp Pelz
Affiliation:
University of California Berkeley, Berkeley, California, United States
Jonathan Schwartz
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Reed Yalisove
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Robert Hovden
Affiliation:
University of Michigan, Ann Arbor, Michigan, United States
Jim Ciston
Affiliation:
Lawrence Berkeley National Laboratory, Berkeley, California, United States
Benjamin Savitzky
Affiliation:
National Center for Electron Microscopy (NCEM), Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, California, United States

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Copyright
Copyright © Microscopy Society of America 2020

References

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Ophus, C, Advanced Structural and Chemical Imaging 3 (13), 11 (2017).10.1186/s40679-017-0046-1CrossRefGoogle Scholar
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Work at the Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. CO acknowledges additional support from the U.S. Department of Energy Early Career Research Award Program. HGB and JC acknowledge additional support from the Presidential Early Career Award for Scientists and Engineers (PECASE) through the U.S. Department of Energy. PP acknowledges support from the STROBE NSF Science and Technology Center on Real-Time Functional Imaging. BHS acknowledges support from the Toyota Research Institute.Google Scholar