Hostname: page-component-586b7cd67f-2brh9 Total loading time: 0 Render date: 2024-11-24T16:29:18.395Z Has data issue: false hasContentIssue false
  • English
  • Français

Improving the Depth Resolution of HAADF Sectioning by 3D Deconvolution

Published online by Cambridge University Press:  30 July 2020

Akimitsu Ishizuka ,
Kazuo Ishizuka ,
Ryo Ishikawa ,
Naoya Shibata ,
Yuichi Ikuhara ,
Hiroki Hashiguchi  and
Ryusuke Sagawa
Akimitsu Ishizuka
Affiliation:
HREM Research Inc., Higashimatsuyama, Saitama, Japan
Kazuo Ishizuka
Affiliation:
HREM Research Inc., Higashimatsuyama, Saitama, Japan
Ryo Ishikawa
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Naoya Shibata
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Yuichi Ikuhara
Affiliation:
University of Tokyo, Bunkyo-ku, Tokyo, Japan
Hiroki Hashiguchi
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Ryusuke Sagawa
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 3110 - 3111
Check for updates
Copyright
Copyright © Microscopy Society of America 2020

References

Borisevich, A.Y., Lupini, A.R., Pennycook, S.J. (2006) Proc. Natl. Acad. Sci. 103, 3044.10.1073/pnas.0507105103CrossRefGoogle Scholar
Ishikawa, R., Lupini, A.R., Hinuma, Y., Pennycook, S.J. (2015) Ultramicroscopy 151, 122.10.1016/j.ultramic.2014.11.009CrossRefGoogle Scholar
DeConvHAADF for DigitalMicrograph: www.hremresearch.com/Eng/plugin/HAADFEng.htmlGoogle Scholar
Richardson, W.H. (1972) J. Opt. Soc. Am. 62, 55; L.B. Lucy (1974) Astron. J. 79, 745.10.1364/JOSA.62.000055CrossRefGoogle Scholar
Ishikawa, R., Pennycook, S.J., Lupini, A.R., et al. . (2016) Appl. Phys. Lett. 109, 163102.10.1063/1.4965709CrossRefGoogle Scholar