Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-28T15:56:05.364Z Has data issue: false hasContentIssue false
  • English
  • Français

Improved Yield and Data Quality in Atom Probe Tomography

Published online by Cambridge University Press:  08 April 2017

R Ulfig ,
E Oltman ,
D Lenz ,
T Payne ,
T Prosa  and
D Larson
R Ulfig
Affiliation:
Cameca Instruments, Inc
E Oltman
Affiliation:
Cameca Instruments, Inc
D Lenz
Affiliation:
Cameca Instruments, Inc
T Payne
Affiliation:
Cameca Instruments, Inc
T Prosa
Affiliation:
Cameca Instruments, Inc
D Larson
Affiliation:
Cameca Instruments, Inc

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 714 - 715
Copyright
Copyright © Microscopy Society of America 2011