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Improved Measurement and Analysis of Series of Valence Electron Energy Loss Spectra and The Local Electronic Structure

Published online by Cambridge University Press:  02 July 2020

H. Müllejans ,
R. H. French ,
G. Duscher  and
M. Rühle
H. Müllejans
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, D-70174Stuttgart, Germany
R. H. French
Affiliation:
DuPont Co. Central Research, E356-384 Experimental Station, Wilmington, DE19880
G. Duscher
Affiliation:
Oak Ridge National Lab, Solid State Division, Oak Ridge, TN, 37831
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Seestr. 92, D-70174Stuttgart, Germany
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Extract

The local electronic structure of ceramic materials can be determined from valence electron energy loss (Veel) spectra via the dielectric function. The quality of the data is comparable to vacuum ultraviolet spectroscopy with the added benefit of high spatial resolution. We have built and implemented a system for spectrum imaging which not only allows automatic data acquisition but also analysis of the full data set. The system consists of a Gatan PEELS and a Gatan Digiscan fitted to a VG HB501 UX STEM and home-built hardware additions. The hardware extensions allow to acquire 1, 2, 3, 4 or 8 spectra for each pixel and in the case of 2 spectra/pixel to vary the exposure time of the specimen to the primary electron beam by controlling the beam blanker (Fig. 1). The first spectrum (2 to 20 ms) contains an unsaturated zero loss peak and the second spectrum (0.05 to 100 s) at the same position the plasmon peak near to but below saturation (Fig. 2).

Type
Quantitative Analysis For Series of Spectra and Images: Getting The Most From Your Experimental Data
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 943 - 944
Copyright
Copyright © Microscopy Society of America 1997

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References

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6. We thank A. D. Pfleiderer for useful discussions and L. K. DeNoyer for software support. One of us (HM) acknowledges the financial support of the Volkswagen Stiftung (I/70082).Google Scholar