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Improved Characterization of Steel Samples by SEM/EDS Through the Use of a Silicon Drift Detector

Published online by Cambridge University Press:  04 August 2017

John Konopka
John Konopka*
Affiliation:
Thermo Fisher Scientific, Madison, WI, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 78 - 79
Copyright
© Microscopy Society of America 2017 

References

[1] Gatti, E. & Rehak, P. Nucl. Instrum. Methods A 1984 42, 12.Google Scholar
[2] Fiori, C. E. & Swyt, C. R. Microbeam Analysis 1992 89–95.Google Scholar
[3] Harrowfield, I. R. & MacRae, C. M. Microbeam Analysis 1988 267–270.Google Scholar
[4] Newbury, D. E. & Ritchie, N. W. M. Materials Science and Technology 2016 1017–1023.Google Scholar