Hostname: page-component-7bb8b95d7b-lvwk9 Total loading time: 0 Render date: 2024-09-19T15:21:52.035Z Has data issue: false hasContentIssue false
  • English
  • Français

The Importance of High-Resolution Scanning Transmission Electron Microscopy For Fine-Scale Dislocation Analysis

Published online by Cambridge University Press:  01 August 2010

PJ Phillips ,
L Kovarik ,
RR Unocic ,
D Wei ,
D Mourer  and
MJ Mills
PJ Phillips
Affiliation:
Ohio State University
L Kovarik
Affiliation:
Ohio State University
RR Unocic
Affiliation:
ORNL
D Wei
Affiliation:
GE Aviation
D Mourer
Affiliation:
GE Aviation
MJ Mills
Affiliation:
Ohio State University

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1798 - 1799
Copyright
Copyright © Microscopy Society of America 2010