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The Importance of Complementary Information Provided by Surface Analysis, Electron Microscopy and in situ Characterization of Nanoparticles

Published online by Cambridge University Press:  01 August 2010

DR Baer ,
JE Amonette ,
A Dohnalkova ,
MH Engelhard ,
S Kuchibhatla ,
J Liu ,
P Nachimuthu ,
JT Nurmi ,
PG Tratnyek  and
C-M Wang
DR Baer
Affiliation:
Pacific Northwest National Laboratory
JE Amonette
Affiliation:
Pacific Northwest National Laboratory
A Dohnalkova
Affiliation:
Pacific Northwest National Laboratory
MH Engelhard
Affiliation:
Pacific Northwest National Laboratory
S Kuchibhatla
Affiliation:
Pacific Northwest National Laboratory
J Liu
Affiliation:
Pacific Northwest National Laboratory
P Nachimuthu
Affiliation:
Pacific Northwest National Laboratory
JT Nurmi
Affiliation:
Oregon Health and Sciences University
PG Tratnyek
Affiliation:
Oregon Health and Sciences University
C-M Wang
Affiliation:
Pacific Northwest National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 408 - 409
Copyright
Copyright © Microscopy Society of America 2010