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Importance of Carbon Contamination in High-Resolution (FEG) EPMA of Silicate Minerals

Published online by Cambridge University Press:  27 August 2014

Ben Buse  and
Stuart Kearns

Abstract

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Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 704 - 705
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Saunders, , et al, Chemical Geology 364 (2014), p. 20.Google Scholar
[2] Reed, SJB in “Electron Microprobe Analysis”, (Cambridge University Press, Cambridge).Google Scholar
[3] Bastin, GFand Heijligers, HJM in “Quantitative electron probe microanalysis of carbon in binary.Google Scholar
carbides”, Technical Report, (Eindhoven University of Technology, Eindhoven, Netherlands).Google Scholar
[4] Pinard, PT, et al, Microscopy and Microanalysis 19 (2013), p. 996.Google Scholar
[5] Waldo, RA Microbeam Analysis 23 (1988), p.310.Google Scholar
[6] Bastin, GFand Heijligers, HJM Scanning 12 (1990), p. 225.Google Scholar