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Implementation of Recycling Routes for Scanning Probe Microscopy Tips

Published online by Cambridge University Press:  06 December 2002

Carolina Pereira de Souza
Affiliation:
Laboratório de Nanoscopia, Dept. de Física, ICEx, Universidade Federal de Minas Gerais, Belo Horizonte, CEP: 30123-970, Brazil
Margareth Spangler Andrade
Affiliation:
Laboratório de Nanoscopia, SDT, Fundação Centro Tecnológico de Minas Gerais, Belo Horizonte, CEP: 31170-000, Brazil
Bernardo Ruegger Almeida Neves
Affiliation:
Laboratório de Nanoscopia, Dept. de Física, ICEx, Universidade Federal de Minas Gerais, Belo Horizonte, CEP: 30123-970, Brazil
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Abstract

In this work, effective, yet simple, recycling mechanisms for used scanning probe microscopy (SPM) tips were implemented. Comprising a tip profile characterization methodology and specific cleaning procedures, which decontaminate SPM tips whether the contamination nature is known or not, such routes were optimized during numerous tests with brand new, previously used, and already discarded categories of SPM tips. The results show that if the used tip suffered contamination only, but no physical damages, during its scanning lifetime, it becomes readily available for reutilization after the cleansing process, characterizing a recycling route. On the other hand, if the tip went through wear and breakages during its utilization, it still can be decontaminated, but may not be directly reutilized due to its inadequate physical profile. Nevertheless, the methodology developed in this work may yet be applied as part of a more complex recycling route.

Type
Research Article
Copyright
© 2002 Microscopy Society of America

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