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The Impact of EDS In Materials Science Microanalysis

Published online by Cambridge University Press:  02 July 2020

D. B. Williams
D. B. Williams*
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA, 18015
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Extract

Since its invention in 1968, the EDS has played an essential role in X-ray analysis of materials, at the micrometer level, in the electron probe microanalyzer (EPMA). In the EPMA, the characteristic X-ray intensity from bulk specimens is sufficient that, despite its very small collection angle, the wavelength dispersive spectrometer (WDS) can also be used. Given the excellent energy resolution of the WDS it has often been the spectrometer of choice for bulk quantitative X-ray microanalysis. Therefore, the most important role of the EDS has been in X-ray microanalysis of thin specimens in the analytical electron microscope (AEM) because, in an AEM, the limited confines of the stage mean that EDS is the only viable spectrometer. Since the pioneering work of Cliff and Lorimer in the 1970s, EDS has been the method by which all high spatial resolution X-ray microanalysis of thin foils has been performed.

Type
30 Years of Energy Dispersive Spectrometry in Microanalysis
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 168 - 169
Copyright
Copyright © Microscopy Society of America

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References

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11. The author wishes to thank Joe Goldstein and his many students and post-docs. The NASA Geochemistry Program funded much of the basic work at Lehigh on thin-foil EDS analysis.Google Scholar