Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-04T19:51:06.281Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Properties and Aberration Analysis of Electrostatic Afocal-Zoom Lenses Using Computer Optimization

Published online by Cambridge University Press:  28 September 2015

Omer Sise
Omer Sise*
Affiliation:
Department, of Science Education, Faculty of Education, Suleyman Demirel University, 32260 Isparta, Turkey.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Electron Optics
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 72 - 77
Copyright
Copyright © Microscopy Society of America 2015 

References

[1]Harting, E & Read, FH in Electrostatic Lenses. Elsevier, Amsterdam, 1976.Google Scholar
[2]Lencova, B in Handbook of Charged Particle Optics (ed. J Orloff, (CRC Press, Boca Raton) (2008). p. 161.CrossRefGoogle Scholar
[3]Yavor, M, Adv. Electron. El. Phys 157 (2009). p. 213.Google Scholar
[4]Hawkes, PW & Kasper, E in Principles of Electron Optics: Applied Geometrical Optics, vol. 2. Academic Press (1989). p. 647.Google Scholar
[5]Martinez, G, Sancho, M & Read, FH, J. Phys. E 16 (1983). p. 631.CrossRefGoogle Scholar
[6]Heddle, DWO, J. Phys. E: Sci. Instrum 4 (1971). p. 981.CrossRefGoogle Scholar
[7]Heddle, DWO & Kay, SM, Nucl. Instrum. Meth. A 298 (1990). p. 291.CrossRefGoogle Scholar
[8]Sakae, T, et al, Rev. Sci. Instrum. 61 (1990). p. 61.CrossRefGoogle Scholar
[9]Bertacco, R, et al, Rev. Sci. Instrum. 73 (2002). p. 3867.CrossRefGoogle Scholar
[10]Zouros, TJM & Benis, EP, Appl. Phys. Lett. 86 (2005), 094105.CrossRefGoogle Scholar
[11]Dogan, M, et al, Rev. Sci. Instrum. 84 (2013), 043105.CrossRefGoogle Scholar
[12]Vikor, L, et al, Nucl. Instrum. Meth. B 114 (1996). p. 164.CrossRefGoogle Scholar
[13]Sise, O, J. Electron Spectrosc 197 (2014). p. 7.CrossRefGoogle Scholar
[14] SIMION 3D v8.1, Scientific Instrument Services Inc., www.simion.com.Google Scholar
[15] Mr. David Manura from Scientific Instrument Services (SIS) is thanked for his many useful discussions and providing technical support in SIMION simulation..Google Scholar