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Imaging Properties and Aberration Analysis of Electrostatic Afocal-Zoom Lenses Using Computer Optimization

Published online by Cambridge University Press:  28 September 2015

Omer Sise
Omer Sise*
Affiliation:
Department, of Science Education, Faculty of Education, Suleyman Demirel University, 32260 Isparta, Turkey.

Abstract

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Type
Electron Optics
Information
Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 72 - 77
Copyright
Copyright © Microscopy Society of America 2015 

References

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[15] Mr. David Manura from Scientific Instrument Services (SIS) is thanked for his many useful discussions and providing technical support in SIMION simulation..Google Scholar