Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-24T13:34:26.517Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging in Liquids through Ultra-thin Membranes: A Comparative Analysis of Scanning Electron and Scanning Microwave Microscopies

Published online by Cambridge University Press:  25 July 2016

Alexander Tselev ,
Jeyavel Velmurugan  and
Andrei Kolmakov
Alexander Tselev
Affiliation:
Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA Institute for Functional Imaging of Materials, Oak Ridge National Laboratory, Oak Ridge, TN 37831,
Jeyavel Velmurugan
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899 Maryland Nano Center, University of Maryland, College Park, MD 20742
Andrei Kolmakov
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, MD 20899

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 352 - 353
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Lai, K., et al, Review of Scientific Instruments vol. 78 (2007). p. 063702.CrossRefGoogle Scholar
[2] Plassard, C., et al, Physical Review B vol. 83 (2011). p. 121409.CrossRefGoogle Scholar
[3] Kopanski, J. J., et al, ECS Transactions vol. 61 (2014). pp. 185–193.CrossRefGoogle Scholar
[4] Tselev, A. & Kolmakov, A. Microwave Conference (EuMC), 2015 European (2015). pp 662–665.CrossRefGoogle Scholar
[5] Tselev, A., et al, vol. 10(3 (2016). pp 3562–3570.CrossRefGoogle Scholar
[6] Kim, S., et al, Applied Physics Letters vol. 86 (2005). p. 153506.CrossRefGoogle Scholar
[7] Farina, M., et al, Microwave and Wireless Components Letters, IEEE vol. 22 (2012). pp. 595–597.CrossRefGoogle Scholar
[8] Noh, K. W., et al, Ultramicroscopy vol. 116 (2012). pp. 34–38.CrossRefGoogle Scholar
[9] Schneider, N. M., et al, The Journal of Physical Chemistry C vol. 118 (2014). pp. 22373–22382.CrossRefGoogle Scholar
[10] Thiberge, S., et al, Review of Scientific Instruments vol. 75 (2004). pp. 2280–2289.CrossRefGoogle Scholar
[11] The research was supported in part through Scientific User Facilities Division (ORNL), Office of Basic Energy Sciences, U. S. Department of Energy, U.S. Civilian Research and Development Foundation and NIST-CNST/UMD-IREAP Cooperative Agreement.Google Scholar