Hostname: page-component-586b7cd67f-r5fsc Total loading time: 0 Render date: 2024-11-29T05:49:44.051Z Has data issue: false hasContentIssue false
  • English
  • Français

Imaging Extended Defects in Low Z materials using Electron Channelling Contrast Imaging – New Approaches and Challenges

Published online by Cambridge University Press:  05 August 2019

G. Naresh-Kumar ,
A. Alasamari ,
Ben Hourahine  and
C. Trager-Cowan
G. Naresh-Kumar*
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
A. Alasamari
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
Ben Hourahine
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
C. Trager-Cowan
Affiliation:
Department of Physics, SUPA, University of Strathclyde, Glasgow, UK.
*
*Corresponding author: [email protected]

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Spectroscopy and Imaging of Nanostructured Low-Z Materials in the Electron Microscope
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1760 - 1761
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Zaefferer, S. and Elhami, N-N., Acta Materialia 75 (2014), p. 20.Google Scholar
[2]Naresh-Kumar, G. et al. , Materials Science in Semiconductor Processing 47, (2016), p. 44.Google Scholar
[3]Kriaa, H., Guitton, A. and Maloufi, N. Scientific Reports 7, (2017), p. 9742.Google Scholar
[4]Danilatos, G. D. Journal of Microscopy, 245 (2012) p. 171.Google Scholar
[5]The authors acknowledge support from the EPSRC grant; “Quantitative non-destructive nanoscale characterisation of advanced materials” (EP/P015719/1).Google Scholar