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Imaging Contrast with Multiple Ion Beams

Published online by Cambridge University Press:  23 September 2015

Huimeng Wu ,
Sybren Sijbrandij ,
Shawn McVey  and
John Notte
Huimeng Wu
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Sybren Sijbrandij
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
Shawn McVey
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA
John Notte
Affiliation:
Ion Microscopy Innovation Center, Carl Zeiss Microscopy LLC, One Corporation Way, Peabody MA 01960, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 701 - 702
Copyright
Copyright © Microscopy Society of America 2015 

Footnotes

*Please refer to doi:10.1017/S1431927615015081

References

[1] Ward, BW, Notte, JA & Economou, NP, Vac. Sci. B 24 (2006), p. 2871.Google Scholar
[2] Laquerre, A & Phaneuf, MW, Microscopy & Microanalysis,14 (2008), p. 620.Google Scholar
[3] http://www.srim.org/.Google Scholar