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Imaging Conductivity in a Single Atomic Layer

Published online by Cambridge University Press:  30 July 2020

Ondrej Dyck ,
Jacob Swett ,
Andrew Lupini  and
Stephen Jesse
Ondrej Dyck
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Jacob Swett
Affiliation:
University of Oxford, Alabama, United States
Andrew Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States
Stephen Jesse
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee, United States

Abstract

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Type
Management and Operation of Microscopy and Microanalysis Facilities
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1704 - 1705
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Copyright
Copyright © Microscopy Society of America 2020

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This work was supported by the U.S. Department of Energy, Office of Science, Basic Energy Sciences, Materials Science and Engineering Division and was performed at the Oak Ridge National Laboratory's Center for Nanophase Materials Sciences (CNMS), a U.S. Department of Energy, Office of Science User Facility.Google Scholar