Hostname: page-component-586b7cd67f-rcrh6 Total loading time: 0 Render date: 2024-11-28T23:10:04.361Z Has data issue: false hasContentIssue false

Identifying Atoms in High Resolution Transmission Electron Micrographs Using a Deep Convolutional Neural Net

Published online by Cambridge University Press:  01 August 2018

Jakob Schiøtz
Affiliation:
Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Jacob Madsen
Affiliation:
Department of Physics, Technical University of Denmark, Kgs. Lyngby, Denmark
Pei Liu
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Kgs. Lyngby, Denmark
Ole Winther
Affiliation:
Department of Applied Mathematics and Computer Science, Technical University of Denmark, Kgs. Lyngby, Denmark.
Jens Kling
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Kgs. Lyngby, Denmark
Jakob Birkedal Wagner
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Kgs. Lyngby, Denmark
Thomas Willum Hansen
Affiliation:
Center for Electron Nanoscopy, Technical University of Denmark, Kgs. Lyngby, Denmark

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Copyright
© Microscopy Society of America 2018 

References

[1] Madsen, J., et al (to be published, https://arxiv.org/abs/1802.03008)..Google Scholar
[2] Madsen, J., et al, Adv. Struct. Chem. Imag 3 2017) p. 14.Google Scholar