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Identification of Cleavage Origins Using Focused Ion Beam (FIB) Sectioning

Published online by Cambridge University Press:  01 August 2002

S. Xu ,
R. Bouchard ,
J. Li  and
W.R. Tyson
S. Xu
Affiliation:
CANMET-Materials Technology Laboratory, 568 Booth St., Ottawa, ON, Canada K1A 0G1
R. Bouchard
Affiliation:
CANMET-Materials Technology Laboratory, 568 Booth St., Ottawa, ON, Canada K1A 0G1
J. Li
Affiliation:
Fibics Inc, 556 Booth St. Suite 200, Ottawa, ON, Canada K1A 0G1
W.R. Tyson
Affiliation:
Fibics Inc, 556 Booth St. Suite 200, Ottawa, ON, Canada K1A 0G1

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 548 - 549
Copyright
Copyright © Microscopy Society of America 2002