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HRTEM Study of Nanostructure of Co/Au Multilayers

Published online by Cambridge University Press:  02 July 2020

Y. Liu ,
B.W. Robertson ,
Z.S. Shan  and
D. J. Sellmyer
Y. Liu
Affiliation:
Center for Materials Research and Analysis, and Department of Mechanical Engineering, Lincoln, NE68588
B.W. Robertson
Affiliation:
Center for Materials Research and Analysis, and Department of Mechanical Engineering, Lincoln, NE68588
Z.S. Shan
Affiliation:
Center for Materials Research and Analysis, and, Behlen Laboratory of Physics, University of Nebraska, Lincoln, NE68588
D. J. Sellmyer
Affiliation:
Center for Materials Research and Analysis, and, Behlen Laboratory of Physics, University of Nebraska, Lincoln, NE68588
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Extract

Multilayer thin films of Co/Au with large magnetic anisotropy are attracting strong interest. Among the factors affecting the film properties are the layer thicknesses of the Au layer and the Co layer. This paper reports the detailed HRTEM study of the nanostructure evolution of Co/Au films as a function of the Au thickness. Two DC-magnetron sputtered films with the same Co thickness 5Å but different Au thicknesses (Au60Å/Co5Å)x9/Au400Å (denoted Au60) and (Au10Å/Co5Å)x50/Au400Å (denoted Au 10) were chosen for detailed study. The Au60 film shows a well defined perpendicular magnetization loop with loop squareness S=l and an anisotropy value of 3xl06erg/cm3 while the Au 10 film shows an irregular perpendicular magnetization loop with S=0 and an anisotropy value of 1.5xl06erg/cm3.

For cross sectional TEM samples, bright field TEM images show that the grain size of the Au underlayer is about 20-80 nm. Slight convex curvature of the multilayers is observed.

Type
Nanocrystals and Nanocomposites: Novel Structures For Catalysis, Electronics, and Micromechanics
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 407 - 408
Copyright
Copyright © Microscopy Society of America 1997

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References

* Research was supported by NSF DMR9623112, NSF OSR9255225 and CMRA.

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