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HRTEM study of growth-correlated properties of (Si,Ge) islands

Published online by Cambridge University Press:  05 September 2003

H. Kirmse ,
R. Otto ,
R. Schneider ,
W. Neumann ,
M. Hanke ,
M. Schmidbauer ,
R. Köhler ,
M. Lentzen ,
K. Urban  and
H. Wawra
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H. Kirmse
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
R. Otto
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
R. Schneider
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
W. Neumann
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
M. Hanke
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
M. Schmidbauer
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
R. Köhler
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, Newtonstraße 15, 12489 Berlin, Germany
M. Lentzen
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
K. Urban
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
H. Wawra
Affiliation:
Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany
T. Boeck
Affiliation:
Institut für Kristallzüchtung, Max-Born-Strasse 2, 12489 Berlin, Germany
I.P. Soshnikov
Affiliation:
Ioffe Physico-Technical Institute, Politekhnicheskaya 26, 194021, St. Petersburg, Russia
N.N. Ledentsov
Affiliation:
Ioffe Physico-Technical Institute, Politekhnicheskaya 26, 194021, St. Petersburg, Russia
Z.F. Krasilnik
Affiliation:
Institute for Physics of Microstructures RAS, Nizhny Novgorod, 603600, Russia
A. Novikov
Affiliation:
Institute for Physics of Microstructures RAS, Nizhny Novgorod, 603600, Russia
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 220 - 221
Copyright
Copyright © Microscopy Society of America 2003

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