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Hrtem Characterization of Interface Between ISO-Structural Thin Solid Film and Substrate

Published online by Cambridge University Press:  01 August 2002

C. M. Wang ,
S. Thevuthasan ,
F. Gao ,
V. Shutthanandan ,
D. E. McCready ,
S. A. Chambers  and
C.H.F. Peden
C. M. Wang
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
S. Thevuthasan
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
F. Gao
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
V. Shutthanandan
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
D. E. McCready
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
S. A. Chambers
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352
C.H.F. Peden
Affiliation:
Interfacial Chemistry and Engineering, Environmental Molecular Sciences Laboratory Pacific Northwest National Laboratory, P.O. Box 999, Mail Stop K8-93, Richland, WA 99352

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1160 - 1161
Copyright
Copyright © Microscopy Society of America 2002