HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM

Michael A. O’Keefe

doi:10.1017/S1431927603444681

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HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM

Published online by Cambridge University Press: 16 July 2003

Michael A. O’Keefe

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Michael A. O’Keefe*: Affiliation:
Materials Science Division, LBNL B2R200, One Cyclotron Road, Berkeley, CA 94720, USA

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Type: Abstract
Information: Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 936 - 937

DOI: https://doi.org/10.1017/S1431927603444681 [Opens in a new window]
Copyright: Copyright © Microscopy Society of America 2003

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HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM

Volume 9, Issue S02
Michael A. O’Keefe ^(a1)
DOI: https://doi.org/10.1017/S1431927603444681

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HRTEM at Half-Ångstrom Resolution: from OÅM to TEAM

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