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HRTEM and EELS Studies on the Structural and Chemical Modification of MoS2 and Graphite During In-situ Reactions with Li and Na

Published online by Cambridge University Press:  30 July 2020

Chanchal Ghosh
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Manish Singh
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Matthew Janish
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Shayani Parida
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
Avinash M Dongare
Affiliation:
University of Connecticut, Storrs, Connecticut, United States
C Barry Carter
Affiliation:
University of Connecticut, Storrs, Connecticut, United States Center for Integrated Nanotechnologies (CINT), Sandia National Laboratories, Albuquerque, New Mexico, United States

Abstract

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Type
In Situ TEM at the Extremes
Copyright
Copyright © Microscopy Society of America 2020

References

Whittingham, MS (2004) Lithium batteries and cathode materials, Chem Rev 104 , 4271-430110.1021/cr020731cCrossRefGoogle ScholarPubMed
Janish, MT, Carter, CB (2015) In situ observations of the lithiation of molybdenum disulfide. Scripta Mater 107, 22-2510.1016/j.scriptamat.2015.05.011CrossRefGoogle Scholar
Chen S, Wang, Shao, R et al. (2018) Atomic structure and migration dynamics of MoS2/LixMoS2 interface. Nano Energy 48, 560-56810.1016/j.nanoen.2018.03.076CrossRefGoogle Scholar
Cheng, Y, Nie, A, Zhang, Q et al. (2014) Origin of the phase transition in lithiated molybdenum disulphide. ACS Nano 8, 11447-1145310.1021/nn505668cCrossRefGoogle Scholar
Carter, CB, Williams, DB (Eds.) (2016) Transmission electron microscopy: Diffraction, Imaging and Spectrometry, Springer, Berlin Heidelberg, 17-8010.1007/978-3-319-26651-0CrossRefGoogle Scholar
Stadelmann, P (1987) EMS – a software package for electron diffraction analysis and HREM image simulation in materials science. Ultramicroscopy 21(2), 131-14510.1016/0304-3991(87)90080-5CrossRefGoogle Scholar