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HREM Observation and Identification of the Causality of Twins in SiGe/Si (110)

Published online by Cambridge University Press:  30 July 2020

Junji Yamanaka ,
Yuichi Sano ,
Shingo Saito ,
Atsushi Onogawa ,
Kosuke Hara ,
Kiyokazu Nakagawa  and
Keisuke Arimoto
Junji Yamanaka
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Yuichi Sano
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Shingo Saito
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Atsushi Onogawa
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Kosuke Hara
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Kiyokazu Nakagawa
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan
Keisuke Arimoto
Affiliation:
University of Yamanashi, Kofu, Yamanashi, Japan

Abstract

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Type
Crystallography at the Nanoscale and MicroED with Electrons and X-rays
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 286 - 288
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Copyright
Copyright © Microscopy Society of America 2020

References

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Yamanaka, Junji et al. , Journal of Materials Science and Chemical Engineering, (2018) vol. 6, pp. 25–31.10.4236/msce.2018.61004CrossRefGoogle Scholar