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Homogeneity and Sample Preparation from Grams to Microns using NAA, uXRF, and SEM-EDS

Published online by Cambridge University Press:  23 September 2015

Abigail P. Lindstrom ,
Jeffrey M. Davis ,
Rolf Zeisler ,
Nicholas WM Ritchie  and
Richard M. Lindstrom
Abigail P. Lindstrom
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, 100 Bureau Drive, Gaithersburg, MD 20899 USA
Jeffrey M. Davis
Affiliation:
PNDetector GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
Rolf Zeisler
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, 100 Bureau Drive, Gaithersburg, MD 20899 USA
Nicholas WM Ritchie
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, 100 Bureau Drive, Gaithersburg, MD 20899 USA
Richard M. Lindstrom
Affiliation:
National Institute of Standards and Technology, Materials Measurement Laboratory, 100 Bureau Drive, Gaithersburg, MD 20899 USA

Abstract

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Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 787 - 788
Copyright
Copyright © Microscopy Society of America 2015